The morphology and structural evolution of nano-SiO2 powers obtained by pressuring?samples and sintering in muffle at different temperatures were studied by X-ray diffraction (XRD)?and atomic force microscope (AFM). The experimental results show that the particle sizes of?nano-SiO2 increase with temperature rising, and it meets the physical mechanism of particle growth
論文下載
作者
Jing Zhang,Qi Zhi Cao,Jian Ying Li
期刊
Advanced Materials Research
年份