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The morphology and structural evolution of nano-SiO2 powers obtained by pressuring?samples and sintering in muffle at different temperatures were studied by X-ray diffraction (XRD)?and atomic force microscope (AFM). The experimental results show that the particle sizes of?nano-SiO2 increase with temperature rising, and it meets the physical mechanism of particle growth

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作者

Jing Zhang,Qi Zhi Cao,Jian Ying Li

期刊

Advanced Materials Research

年份