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High Performance
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● Atomic-scale of resolution
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● Large sample size
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● With a DSP inside for great performance
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● Realtime operating system embedded
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● Fast Ethernet connection with computer
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Multi-function
● Atomic Force Microscope (AFM)
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● Scanning Tunneling Microscope (STM)
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● Lateral Force Microscope (LFM)
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● Force Analysis: I-V Curve, I-Z Curve, Force Curve
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● Online real-time 3D image for better observation
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● Multi-channel signals for more sample details
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● Trace-Retrace scan, Back-Forward scan
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● Multi-Analysis: Granularity and Roughness
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● Data load-out for further analysis
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Easy Operation
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● Fast automatically tip-engaging
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● Simple change the tipholder to switch between STM and AFM
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● Full digital control, auto system status recognition
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● Software-based sample movement
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● Nano-Movie function: Continuous data collection, storage and replay
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● Modularized design for convenience of maintenance and future upgrade
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