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An atomic force microscope (AFM) usually?employs proportional-integral (PI) control strategy to sustain a
constant cantilever deflection. However, it is well known that?the tuning of PI parameters is a tedious and complicated
procedure, especially for those unfamiliar with control theory.?In this paper, we employ and implement relay controller to
automate the tuning procedure for contact-mode AFM PI?controller during different scanning speed operations based on
relay with hysteresis. Experimental results show that this?approach offers system with satisfactory step response with
typical settling time of about 2 ms. Moreover, better sample?topography image can be obtained after auto-tuning the control
gains during different scanning speed.