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The coincidence scanning mode has been developed by analyzing feedback equations for constant-current scanning and imaging surfaces with atomic resolution with the new mode.This mode can be almost applied to the feedback control of all sorts of SPM instruments,and reduces the scanning time to 60%.

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作者

Fu Xing;Wei Xiaolei;Li Mengchao;Hu Xiao tang.

期刊

Proceedings of the Second International Symposium on Instrumentation Science and Technology(2002)

年份